Analyze Your Exposure to Memory-Based Zero Days and CVEs
Request a Free Analysis
A RunSafe expert will reach out to help you analyze your risk.
Are you leaving your embedded software exposed to attack?
Memory safety vulnerabilities are the single biggest class of risk in embedded devices. RunSafe’s Risk Reduction Analysis gives you insight into your memory-based CVEs and exposure to zero days so you can take action to secure your embedded systems.
What to Expect
Prepare a binary and/or SBOM you want to analyze to determine your risk exposure.
RunSafe cyber experts will analyze your exposure, backed by novel academic research, to calculate the risk to your embedded systems.
Get a score of your total exposure and risk reductions when runtime protections are applied.
How It Works: Risk Exposure Analysis
The RunSafe Risk Reduction Analysis, developed out of research from Linköping University, is designed to expose the risk to software from both known and unknown vulnerabilities.
For over a decade, return oriented programming (ROP) has been the go-to method for arbitrary code execution (ACE) attacks. Unlike traditional code injection, ROP works by reusing snippets of a program’s own code to build a malicious payload, known as a ROP chain.
The RunSafe Risk Reduction Analysis reveals exposure to memory-based zero days by quantifying the number of ROP chains within software that can cause devastating effects when exploited by an attacker.
The analysis then measures risk reduction by analyzing exploit potential of both known CVEs and zero days before and after implementing RunSafe’s patented memory relocation technology.
By significantly reducing the number of available devastating ROP chains—often to nearly zero—RunSafe minimizes the risk of code misuse attacks and strengthens software security.
Request a Free Analysis
A RunSafe expert will reach out to help you analyze your risk.